Abstract
A combination of accumulative roll bonding and rolling is used to fabricate bulk sheets of multilayer Cu-Nb bimetallic composites. Alterations in the processing sequence are made in comparison with prior studies in order to expand the processing window available for bimetallic multilayer composites. Cu-Nb composites with layer thicknesses ranging from 45 μm to 10 nm with accompanying total strains of 3.8 to 12.21 are characterized via neutron diffraction, electron back scatter diffraction, and transmission electron microscopy. These characterization methods provide microstructural information such as layer morphology and grain morphology as well as orientation information such as texture and interface plane normal distribution. The evolution of these microstructural characteristics is collected as a function of increasing strain. These results can provide guidance, inputs, and validation for multiscale predictive models that are being developed on materials with interfacially-driven properties. Finally, synthesis pathways are presented that allow the fabrication of nanoscale multilayer composites with predominant interfacial structures. These fabricated materials are ideal for exploring the relative importance between inter-phase interfacial density and atomic interfacial structure in determining material properties.
Original language | English (US) |
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Pages (from-to) | 2192-2208 |
Number of pages | 17 |
Journal | Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science |
Volume | 45 |
Issue number | 4 |
DOIs | |
State | Published - Apr 2014 |
Bibliographical note
Funding Information:This work is supported by the Los Alamos National Laboratory Directed Research and Development (LDRD) Project DR20110029. Los Alamos National Laboratory is operated by Los Alamos National Security LLC under DOE Contract DE-AC52-06NA25396. Neutron diffraction results were collected on the high pressure preferred orientation (HIPPO) beam line at the Los Alamos Neutron Science Center with the help of Dr. S.C. Vogel. Electron microscopy was performed at the Los Alamos Electron Microscopy Laboratory. The authors would also like to acknowledge discussions with Dr. W.Z. Han.