Properties of high-k/ultrahigh purity silicon nitride stacks

X. Shi, M. Shriver, Z. Zhang, T. Higman, S. A. Campbell

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

Fingerprint

Dive into the research topics of 'Properties of high-k/ultrahigh purity silicon nitride stacks'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy

Chemical Compounds