Reflection high-energy electron-diffraction studies of the growth of YBa2Cu3O7-x and DyBa2Cu3O7-x superconducting thin films

Engineering & Materials Science

• Reflection high energy electron diffraction 100%
• Superconducting films 88%
• Substrates 28%
• Rutherford backscattering spectroscopy 15%
• Fluxes 13%
• Superconductivity 12%
• Temperature 9%
• Partial pressure 9%
• Nucleation 8%
• Thin films 7%
• Oxygen 6%

Physics & Astronomy

• high energy electrons 48%
• electron diffraction 41%
• oscillations 30%
• thin films 24%
• electron microscopes 6%
• partial pressure 4%
• time dependence 4%
• backscattering 3%
• temperature 3%
• superconductivity 3%
• nucleation 3%
• oxygen 2%
• profiles 2%
• cells 2%
• predictions 2%

Chemical Compounds

• Reflection High Energy Electron Diffraction 78%
• Rutherford Backscattering Spectroscopy 5%
• Superconductivity 5%
• Liquid Film 4%
• Partial Pressure 4%
• Nucleation 3%
• Time 3%
• Surface 2%
• Dioxygen 2%
• Reaction Yield 1%