Reliability enhancement of flash-memory storage systems: An efficient version-based design

Yuan Hao Chang, Po Chun Huang, Pei Han Hsu, Lue Jane Lee, Tei Wei Kuo, David Hung Chang Du

Research output: Contribution to journalArticlepeer-review

15 Scopus citations

Abstract

In recent years, reliability has become one critical issue in the designs of flash-memory file/storage systems, due to the growing unreliability of advanced flash-memory chips. In this paper, a version-based design is proposed to effectively and efficiently maintain the consistency among page versions of a file for potential recovery needs. In particular, a two-version one for a native file system is presented with the minimal overheads in version maintenance. A recovery scheme is then presented to restore a corrupted file back to the latest consistent version. The design is later extended to maintain multiple data versions with the considerations of the write constraints of multilevel-cell flash memory. It was shown that the proposed design could significantly improve the reliability of flash memory with limited management and space overheads.

Original languageEnglish (US)
Article number6212465
Pages (from-to)2503-2515
Number of pages13
JournalIEEE Transactions on Computers
Volume62
Issue number12
DOIs
StatePublished - Nov 25 2013

Keywords

  • ECC
  • Flash memory
  • MLC
  • Poisson distribution
  • YAFFS
  • binomial distribution
  • file system
  • forward copying
  • queue
  • recovery
  • reliability
  • two version

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