@inproceedings{b666d6f2846649f98ee5786e97af0988,
title = "Reliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies",
abstract = "Ring oscillator (RO) structures that separate NBTI and PBTI effects are implemented in a high-k metal gate technology. The measurement results clearly show significant RO frequency degradation from PBTI as well as NBTI. For comparison, RO structures with the same principle are also implemented in a SiO2/poly-gate technology, where PBTI is negligible. Experimental results show noticeable frequency degradation under NBTI-only stress mode but negligible degradation under PBTI-only mode, which illustrates the validity of the proposed principle and structures.",
keywords = "Circuit, NBTI, PBTI, Ring Oscillator",
author = "Kim, {Jae Joon} and Linder, {Barry P.} and Rao, {Rahul M.} and Kim, {Tae Hyoung} and Lu, {Pong Fei} and Jenkins, {Keith A.} and Kim, {Chris H.} and Aditya Bansal and Saibal Mukhopadhyay and Chuang, {Ching Te}",
year = "2011",
month = jun,
day = "23",
doi = "10.1109/IRPS.2011.5784450",
language = "English (US)",
isbn = "9781424491117",
series = "IEEE International Reliability Physics Symposium Proceedings",
pages = "2B.4.1--2B.4.4",
booktitle = "2011 International Reliability Physics Symposium, IRPS 2011",
note = "49th International Reliability Physics Symposium, IRPS 2011 ; Conference date: 10-04-2011 Through 14-04-2011",
}