Resonant x-ray scattering study of the antiferroelectric and ferrielectric phases in liquid crystal devices

L. S. Matkin; S. J. Watson; H. F. Gleeson; R. Pindak; J. Pitney; P. M. Johnson; C. C. Huang; P. Barois; A. M. Levelut; G. Srajer; J. Pollmann; J. W. Goodby; M. Hird

doi:10.1103/PhysRevE.64.021705

Resonant x-ray scattering study of the antiferroelectric and ferrielectric phases in liquid crystal devices

L. S. Matkin, S. J. Watson, H. F. Gleeson, R. Pindak, J. Pitney, P. M. Johnson, C. C. Huang, P. Barois, A. M. Levelut, G. Srajer, J. Pollmann, J. W. Goodby, M. Hird

Physics and Astronomy (Twin Cities)

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Abstract

Resonant X-ray scattering of the antiferrolectric and ferrielectric phases in liquid crystal devices was studied. Transition of the antiferroelectric phase to an unwound ferroelectric state on the application of a high electric field was also investigated. The results showed that no helical unwinding occurs at fields lower than the chevron to bookshelf threshold.

Original language	English (US)
Article number	021705
Pages (from-to)	217051-217056
Number of pages	6
Journal	Physical Review E - Statistical, Nonlinear, and Soft Matter Physics
Volume	64
Issue number	2
DOIs	https://doi.org/10.1103/PhysRevE.64.021705
State	Published - Aug 2001

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Matkin, L. S., Watson, S. J., Gleeson, H. F., Pindak, R., Pitney, J., Johnson, P. M., Huang, C. C., Barois, P., Levelut, A. M., Srajer, G., Pollmann, J., Goodby, J. W., & Hird, M. (2001). Resonant x-ray scattering study of the antiferroelectric and ferrielectric phases in liquid crystal devices. Physical Review E - Statistical, Nonlinear, and Soft Matter Physics, 64(2), 217051-217056. Article 021705. https://doi.org/10.1103/PhysRevE.64.021705

Matkin, LS, Watson, SJ, Gleeson, HF, Pindak, R, Pitney, J, Johnson, PM, Huang, CC, Barois, P, Levelut, AM, Srajer, G, Pollmann, J, Goodby, JW & Hird, M 2001, 'Resonant x-ray scattering study of the antiferroelectric and ferrielectric phases in liquid crystal devices', Physical Review E - Statistical, Nonlinear, and Soft Matter Physics, vol. 64, no. 2, 021705, pp. 217051-217056. https://doi.org/10.1103/PhysRevE.64.021705

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AU - Pitney, J.

AU - Johnson, P. M.

AU - Huang, C. C.

AU - Barois, P.

AU - Levelut, A. M.

AU - Srajer, G.

AU - Pollmann, J.

AU - Goodby, J. W.

AU - Hird, M.

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Resonant x-ray scattering study of the antiferroelectric and ferrielectric phases in liquid crystal devices

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