Resonant x-ray scattering study of the antiferroelectric and ferrielectric phases in liquid crystal devices

L. S. Matkin, S. J. Watson, H. F. Gleeson, R. Pindak, J. Pitney, P. M. Johnson, C. C. Huang, P. Barois, A. M. Levelut, G. Srajer, J. Pollmann, J. W. Goodby, M. Hird

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Abstract

Resonant X-ray scattering of the antiferrolectric and ferrielectric phases in liquid crystal devices was studied. Transition of the antiferroelectric phase to an unwound ferroelectric state on the application of a high electric field was also investigated. The results showed that no helical unwinding occurs at fields lower than the chevron to bookshelf threshold.

Original languageEnglish (US)
Article number021705
Pages (from-to)217051-217056
Number of pages6
JournalPhysical Review E - Statistical, Nonlinear, and Soft Matter Physics
Volume64
Issue number2
DOIs
StatePublished - Aug 2001

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