Scanning electrochemical microscopy with simultaneous independent topography

P. I. James, L. F. Garfias-Mesias, P. J. Moyer, W. H. Smyrl

Research output: Contribution to journalArticlepeer-review

103 Scopus citations

Abstract

A new method to perform scanning electrochemical microscopy (SECM) and topography simultaneously is described here. The new method uses a conventional scanning microelectrode to sense species released by local electrochemical reactions on the surface of a sample, combined with shear-force feedback to maintain the probe at a constant distance from the surface of the material. By using shear-force feedback, larger electrochemical currents can be detected at the microelectrode because the probe is scanned at a closer distance from the surface of the sample. The new method has yielded high lateral resolution topography and SECM images are reported here.

Original languageEnglish (US)
Pages (from-to)L64-L66
JournalJournal of the Electrochemical Society
Volume145
Issue number4
DOIs
StatePublished - Apr 1998

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