Scanning Probe Microscopy

Murti V. Salapaka, Srinivasa M. Salapaka

Research output: Contribution to journalArticlepeer-review

189 Scopus citations
Original languageEnglish (US)
Pages (from-to)65-83
Number of pages19
JournalIEEE Control Systems
Volume28
Issue number2
DOIs
StatePublished - Apr 2008

Bibliographical note

Funding Information:
This research was partially supported by NSF under the grants ECS 0449310 CAR, ECS-0601571, ECS-0330224, CMS-0201516, and ECS-9733802. We wish to thank Kishan Baheti for facilitating workshops and sessions in scanning probe microscopy, which have led to fruitful collaborations among researchers from industry and academia.

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