Original language | English (US) |
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Pages (from-to) | 65-83 |
Number of pages | 19 |
Journal | IEEE Control Systems |
Volume | 28 |
Issue number | 2 |
DOIs | |
State | Published - Apr 2008 |
Bibliographical note
Funding Information:This research was partially supported by NSF under the grants ECS 0449310 CAR, ECS-0601571, ECS-0330224, CMS-0201516, and ECS-9733802. We wish to thank Kishan Baheti for facilitating workshops and sessions in scanning probe microscopy, which have led to fruitful collaborations among researchers from industry and academia.