Silicon odometers: Compact in situ aging sensors for robust system design

Xiaofei Wang, John Keane, Tony Tae Hyoung Kim, Pulkit Jain, Qianying Tang, Chris H. Kim

Research output: Contribution to journalReview articlepeer-review

17 Scopus citations

Abstract

This article reviews several unique test-chip designs that demonstrate the benefits of utilizing on-chip logic and a simple test interface to automate circuit aging experiments. This new class of compact on-chip sensors can reveal important aspects of circuit aging that would otherwise be impossible to measure, facilitate the collection of reliability data from systems deployed in the field, and eventually lead us down the path to real-time aging compensation in future processors.

Original languageEnglish (US)
Article number6728928
Pages (from-to)74-85
Number of pages12
JournalIEEE Micro
Volume34
Issue number6
DOIs
StatePublished - Nov 1 2014

Keywords

  • Aging
  • Bias temperature instability
  • Circuit reliability
  • Circuit stability
  • Frequency measurement
  • Hot carrier injection
  • In-situ sensor
  • Monitoring
  • Network-on-chip
  • Odometers
  • On-chip sensor
  • Random telegraph noise
  • Reliability monitor
  • Sensors
  • Telegraphy
  • Temperature measurement
  • Time-dependent dielectric breakdown
  • Variation

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