Abstract
This article reviews several unique test-chip designs that demonstrate the benefits of utilizing on-chip logic and a simple test interface to automate circuit aging experiments. This new class of compact on-chip sensors can reveal important aspects of circuit aging that would otherwise be impossible to measure, facilitate the collection of reliability data from systems deployed in the field, and eventually lead us down the path to real-time aging compensation in future processors.
Original language | English (US) |
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Article number | 6728928 |
Pages (from-to) | 74-85 |
Number of pages | 12 |
Journal | IEEE Micro |
Volume | 34 |
Issue number | 6 |
DOIs | |
State | Published - Nov 1 2014 |
Bibliographical note
Publisher Copyright:© 2014 IEEE.
Keywords
- Aging
- Bias temperature instability
- Circuit reliability
- Circuit stability
- Frequency measurement
- Hot carrier injection
- In-situ sensor
- Monitoring
- Network-on-chip
- Odometers
- On-chip sensor
- Random telegraph noise
- Reliability monitor
- Sensors
- Telegraphy
- Temperature measurement
- Time-dependent dielectric breakdown
- Variation