Abstract
In this paper, our goal is to rapidly locating a few outliers and recover a low dimensional space spanned by inliers, with the particular interest when the outliers have known basis. A simple two-step approach is proposed based on a sketching procedure with theoretical guarantees for the performance. We show that exact identification of the outliers and recovery of the subspace can be achieved using sketched samples as few as the rank plus the number of outliers, ignoring logarithmic factors. This results in significant improvement on both sampling and computational efficiency. Comprehensive numerical experiments are provided to show the efficiency of our proposed method.
Original language | English (US) |
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Title of host publication | Conference Record - 53rd Asilomar Conference on Circuits, Systems and Computers, ACSSC 2019 |
Editors | Michael B. Matthews |
Publisher | IEEE Computer Society |
Pages | 702-706 |
Number of pages | 5 |
ISBN (Electronic) | 9781728143002 |
DOIs | |
State | Published - Nov 2019 |
Event | 53rd Asilomar Conference on Circuits, Systems and Computers, ACSSC 2019 - Pacific Grove, United States Duration: Nov 3 2019 → Nov 6 2019 |
Publication series
Name | Conference Record - Asilomar Conference on Signals, Systems and Computers |
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Volume | 2019-November |
ISSN (Print) | 1058-6393 |
Conference
Conference | 53rd Asilomar Conference on Circuits, Systems and Computers, ACSSC 2019 |
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Country/Territory | United States |
City | Pacific Grove |
Period | 11/3/19 → 11/6/19 |
Bibliographical note
Funding Information:The authors would like to graciously acknowledge support from DARPA Young Faculty Award, Grant No. N66001-14-1-4047
Publisher Copyright:
© 2019 IEEE.
Keywords
- data sketching
- dictionary
- outlier identification
- robust PCA