Small size strength dependence on dislocation nucleation

J. D. Nowak, A. R. Beaber, O. Ugurlu, Steven L Girshick, William W Gerberich

Research output: Contribution to journalArticlepeer-review

34 Scopus citations

Abstract

We use the ex situ and in situ deformation of silicon nano-spheres to investigate the mechanism(s) responsible for hardening, which consequently affects strength. With spheres in the 40-400 nm range, an inverse strength dependence was found. Applicability of linear, forest and/or exhaustion hardening are explored with the hypothesis that all three are of the same class limited by dislocation nucleation.

Original languageEnglish (US)
Pages (from-to)819-822
Number of pages4
JournalScripta Materialia
Volume62
Issue number11
DOIs
StatePublished - Jun 1 2010

Keywords

  • In situ TEM
  • Nano-indentation
  • Plastic deformation
  • Silicon

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