Stability and sensitivity analysis of periodic orbits in Tapping Mode Atomic Force microscopy

Murti V. Salapaka, D. J. Chen, J. P. Cleveland

Research output: Contribution to journalConference articlepeer-review

4 Scopus citations

Abstract

In this paper, the most widely used mode of atomic force microscopy imaging where the cantilever is oscillated at its resonant frequency is studied. It is shown that the amplitude and the sine of the phase of the orbit vary linearly with respect to the cantilever-sample distance. Experiments conducted on a silicon cantilever agree with the theory developed.

Original languageEnglish (US)
Pages (from-to)2047-2052
Number of pages6
JournalProceedings of the IEEE Conference on Decision and Control
Volume2
StatePublished - Dec 1 1998
EventProceedings of the 1998 37th IEEE Conference on Decision and Control (CDC) - Tampa, FL, USA
Duration: Dec 16 1998Dec 18 1998

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