In this paper, the most widely used mode of atomic force microscopy imaging where the cantilever is oscillated at its resonant frequency is studied. It is shown that the amplitude and the sine of the phase of the orbit vary linearly with respect to the cantilever-sample distance. Experiments conducted on a silicon cantilever agree with the theory developed.
|Original language||English (US)|
|Number of pages||6|
|Journal||Proceedings of the IEEE Conference on Decision and Control|
|State||Published - Dec 1 1998|
|Event||Proceedings of the 1998 37th IEEE Conference on Decision and Control (CDC) - Tampa, FL, USA|
Duration: Dec 16 1998 → Dec 18 1998