Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

Saurabh Kumar; Minki Cho; Luke Eversen; Hoonki Kim; Qianying Tang; Paul Mazanec; Pascal Meinerzhagen; Andres Malavasi; Dan Lake; Carlos Tokunaga; Heather Quinn; Muhammad Khellah; James Tschanz; Shekhar Borkar; Vivek De; Chris H. Kim

doi:10.23919/VLSIC.2017.8008570

Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

Saurabh Kumar, Minki Cho, Luke Eversen, Hoonki Kim, Qianying Tang, Paul Mazanec, Pascal Meinerzhagen, Andres Malavasi, Dan Lake, Carlos Tokunaga, Heather Quinn, Muhammad Khellah, James Tschanz, Shekhar Borkar, Vivek De, Chris H. Kim

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A novel BSC circuit with tunable current starved buffers demonstrates higher sensitivity, scalability & accurate statistical characterization of radiation-induced SET pulse waveforms & flip-flop SER in 14nm tri-gate CMOS, thus enabling improved SER estimation & analysis for a range of supply voltages including NTV.

Original language	English (US)
Title of host publication	2017 Symposium on VLSI Circuits, VLSI Circuits 2017
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	C114-C115
ISBN (Electronic)	9784863486065
DOIs	https://doi.org/10.23919/VLSIC.2017.8008570
State	Published - Aug 10 2017
Event	31st Symposium on VLSI Circuits, VLSI Circuits 2017 - Kyoto, Japan Duration: Jun 5 2017 → Jun 8 2017

Publication series

Name	IEEE Symposium on VLSI Circuits, Digest of Technical Papers

Other

Other	31st Symposium on VLSI Circuits, VLSI Circuits 2017
Country/Territory	Japan
City	Kyoto
Period	6/5/17 → 6/8/17

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Publisher Copyright:
© 2017 JSAP.

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10.23919/VLSIC.2017.8008570

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Kumar, S., Cho, M., Eversen, L., Kim, H., Tang, Q., Mazanec, P., Meinerzhagen, P., Malavasi, A., Lake, D., Tokunaga, C., Quinn, H., Khellah, M., Tschanz, J., Borkar, S., De, V., & Kim, C. H. (2017). Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique. In 2017 Symposium on VLSI Circuits, VLSI Circuits 2017 (pp. C114-C115). Article 8008570 (IEEE Symposium on VLSI Circuits, Digest of Technical Papers). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/VLSIC.2017.8008570

Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique. / Kumar, Saurabh; Cho, Minki; Eversen, Luke et al.
2017 Symposium on VLSI Circuits, VLSI Circuits 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. C114-C115 8008570 (IEEE Symposium on VLSI Circuits, Digest of Technical Papers).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Kumar, S, Cho, M, Eversen, L, Kim, H, Tang, Q, Mazanec, P, Meinerzhagen, P, Malavasi, A, Lake, D, Tokunaga, C, Quinn, H, Khellah, M, Tschanz, J, Borkar, S, De, V & Kim, CH 2017, Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique. in 2017 Symposium on VLSI Circuits, VLSI Circuits 2017., 8008570, IEEE Symposium on VLSI Circuits, Digest of Technical Papers, Institute of Electrical and Electronics Engineers Inc., pp. C114-C115, 31st Symposium on VLSI Circuits, VLSI Circuits 2017, Kyoto, Japan, 6/5/17. https://doi.org/10.23919/VLSIC.2017.8008570

Kumar S, Cho M, Eversen L, Kim H, Tang Q, Mazanec P et al. Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique. In 2017 Symposium on VLSI Circuits, VLSI Circuits 2017. Institute of Electrical and Electronics Engineers Inc. 2017. p. C114-C115. 8008570. (IEEE Symposium on VLSI Circuits, Digest of Technical Papers). doi: 10.23919/VLSIC.2017.8008570

Kumar, Saurabh ; Cho, Minki ; Eversen, Luke et al. / Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique. 2017 Symposium on VLSI Circuits, VLSI Circuits 2017. Institute of Electrical and Electronics Engineers Inc., 2017. pp. C114-C115 (IEEE Symposium on VLSI Circuits, Digest of Technical Papers).

@inproceedings{27c23ddd6a6d4184bbfdbd55b4b13678,

title = "Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique",

abstract = "A novel BSC circuit with tunable current starved buffers demonstrates higher sensitivity, scalability & accurate statistical characterization of radiation-induced SET pulse waveforms & flip-flop SER in 14nm tri-gate CMOS, thus enabling improved SER estimation & analysis for a range of supply voltages including NTV.",

author = "Saurabh Kumar and Minki Cho and Luke Eversen and Hoonki Kim and Qianying Tang and Paul Mazanec and Pascal Meinerzhagen and Andres Malavasi and Dan Lake and Carlos Tokunaga and Heather Quinn and Muhammad Khellah and James Tschanz and Shekhar Borkar and Vivek De and Kim, {Chris H.}",

note = "Publisher Copyright: {\textcopyright} 2017 JSAP.; 31st Symposium on VLSI Circuits, VLSI Circuits 2017 ; Conference date: 05-06-2017 Through 08-06-2017",

year = "2017",

month = aug,

day = "10",

doi = "10.23919/VLSIC.2017.8008570",

language = "English (US)",

series = "IEEE Symposium on VLSI Circuits, Digest of Technical Papers",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "C114--C115",

booktitle = "2017 Symposium on VLSI Circuits, VLSI Circuits 2017",

}

TY - GEN

T1 - Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

AU - Kumar, Saurabh

AU - Cho, Minki

AU - Eversen, Luke

AU - Kim, Hoonki

AU - Tang, Qianying

AU - Mazanec, Paul

AU - Meinerzhagen, Pascal

AU - Malavasi, Andres

AU - Lake, Dan

AU - Tokunaga, Carlos

AU - Quinn, Heather

AU - Khellah, Muhammad

AU - Tschanz, James

AU - Borkar, Shekhar

AU - De, Vivek

AU - Kim, Chris H.

PY - 2017/8/10

Y1 - 2017/8/10

N2 - A novel BSC circuit with tunable current starved buffers demonstrates higher sensitivity, scalability & accurate statistical characterization of radiation-induced SET pulse waveforms & flip-flop SER in 14nm tri-gate CMOS, thus enabling improved SER estimation & analysis for a range of supply voltages including NTV.

AB - A novel BSC circuit with tunable current starved buffers demonstrates higher sensitivity, scalability & accurate statistical characterization of radiation-induced SET pulse waveforms & flip-flop SER in 14nm tri-gate CMOS, thus enabling improved SER estimation & analysis for a range of supply voltages including NTV.

UR - http://www.scopus.com/inward/record.url?scp=85034032872&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85034032872&partnerID=8YFLogxK

U2 - 10.23919/VLSIC.2017.8008570

DO - 10.23919/VLSIC.2017.8008570

M3 - Conference contribution

AN - SCOPUS:85034032872

T3 - IEEE Symposium on VLSI Circuits, Digest of Technical Papers

SP - C114-C115

BT - 2017 Symposium on VLSI Circuits, VLSI Circuits 2017

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 31st Symposium on VLSI Circuits, VLSI Circuits 2017

Y2 - 5 June 2017 through 8 June 2017

ER -

Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

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