@inproceedings{71affd01fa184385babefbacc88f2f34,
title = "Statistically translating low-level error probabilities to increase the accuracy and efficiency of reliability simulations in hardware description languages",
abstract = "Radiation induced single-event upsets are becoming an increasing issue for designers due to the impact on overall design reliability. This paper presents a method for translating probabilistic information from lower levels in the design hierarchy into efficient, fast, and useful tools at higher levels. This method allows designers to incorporate soft error reliability analysis into the verification process at greatly reduced simulation expense with high accuracy. We also include metrics to estimate the error in the method. Results from both abstracted verification simulations and Verilog soft error simulations are presented. Our method bridges a gap between low level reliability measurements and high level reliability simulations.",
keywords = "Fault distribution, Reliability analysis, SER, SEU",
author = "Ness, {Drew C.} and Lilja, {David J.}",
year = "2008",
doi = "10.1145/1366110.1366181",
language = "English (US)",
isbn = "9781595939999",
series = "Proceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI",
pages = "297--302",
booktitle = "GLSVLSI 2008",
note = "GLSVLSI 2008: 18th ACM Great Lakes Symposium on VLSI 2008 ; Conference date: 04-03-2008 Through 06-03-2008",
}