The Stellar X-Ray Polarimeter (SXRP) will be the third orbiting stellar x-ray polarimeter, and should provide an order of magnitude increase in polarization sensitivity over its predecessors. The SXRP exploits the polarization dependence of reflection from a graphite Bragg crystal and scattering from a lithium Thomsom scattering target to measure the linear polarization of x-rays from astrophysical sources. In this paper, we review the status of the SXRP instrument.
|Original language||English (US)|
|Number of pages||6|
|Journal||Proceedings of SPIE - The International Society for Optical Engineering|
|State||Published - Feb 15 1994|
|Event||X-Ray and Ultraviolet Polarimetry 1993 - San Diego, United States|
Duration: Jul 11 1993 → Jul 16 1993
Bibliographical noteFunding Information:
It is a pleasure to acknowledge the contributions that many people have made to the SXRP. We wish to thank Joe Chavez, Larry Walker, Howard Seltzer, Jim Daniels, Tad Ashlock, Jerry Strother, Ron Akau, and Kate Olsberg of the Sandia National Laboratories; and Irwin Rochwarger, Hugh Denning, and Jay Demas of Columbia University. The project would not be possible without their support. For completeness, this paper includes material originally presented in Kaaret (1990, 1992), Elsner (1990), and Weisskopf(1990). This work was supported by NASA grant NAG 5-6 18.