TY - JOUR
T1 - STM of freeze-fracture replicas
T2 - problems and promises
AU - Woodward, J. T.
AU - Zasadzinski, J. A N
PY - 1993/12/1
Y1 - 1993/12/1
N2 - Presently, non-conductive surfaces can be examined in two ways: using AFM, which measures the deflection of a weak spring, or coating or replicating non-conductive surfaces with metal layers, then imaging with the scanning tunneling microscope (STM). This revised STM-replica technique provides with simple, repeatable measures of surface feature heights, providing that precautions are taken to avoid feature distortions due to contamination. The cadmium arachidate multilayers provide a well characterized calibration for the 5nm range that will be useful for investigations of bilayer structure and topology.
AB - Presently, non-conductive surfaces can be examined in two ways: using AFM, which measures the deflection of a weak spring, or coating or replicating non-conductive surfaces with metal layers, then imaging with the scanning tunneling microscope (STM). This revised STM-replica technique provides with simple, repeatable measures of surface feature heights, providing that precautions are taken to avoid feature distortions due to contamination. The cadmium arachidate multilayers provide a well characterized calibration for the 5nm range that will be useful for investigations of bilayer structure and topology.
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M3 - Article
AN - SCOPUS:0027704458
SN - 0424-8201
SP - 68
EP - 69
JO - Proceedings - Annual Meeting, Microscopy Society of America
JF - Proceedings - Annual Meeting, Microscopy Society of America
ER -