STM of freeze-fracture replicas: problems and promises

J. T. Woodward, J. A N Zasadzinski

Research output: Contribution to journalArticlepeer-review

Abstract

Presently, non-conductive surfaces can be examined in two ways: using AFM, which measures the deflection of a weak spring, or coating or replicating non-conductive surfaces with metal layers, then imaging with the scanning tunneling microscope (STM). This revised STM-replica technique provides with simple, repeatable measures of surface feature heights, providing that precautions are taken to avoid feature distortions due to contamination. The cadmium arachidate multilayers provide a well characterized calibration for the 5nm range that will be useful for investigations of bilayer structure and topology.

Original languageEnglish (US)
Pages (from-to)68-69
Number of pages2
JournalProceedings - Annual Meeting, Microscopy Society of America
StatePublished - Dec 1 1993

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