Structural Effects of Ti Underlayer on CoCrPt Magnetic Films

C. J. Sun, G. M. Chow, E. W. Soo, J. P. Wang, Y. K. Hwu, T. S. Cho, J. H. Je, H. H. Lee, J. W. Kim, D. Y. Noh

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

The effects of long-range and short-range orders of Ti underlayer thickness on the magnetic properties of sputtered Co 72Cr 21 Pt 7 films were investigated using synchrotron X-ray scattering and X-ray absorption near-edge structure spectroscopy. The results were consistent with that of magnetic measurements and X-ray photoelectron spectroscopy. For thin Ti underlayers (10 nm), the oxidation of Ti and significant mixing of other elements within this underlayer did not promote texture development, further resulting in poor texturing of magnetic films and undesirable magnetic properties. Increased crystallinity and texture of metallic Ti in thicker underlayers enhanced the magnetic peak alignment and its properties.

Original languageEnglish (US)
Pages (from-to)271-273
Number of pages3
JournalJournal of Nanoscience and Nanotechnology
Volume1
Issue number3
DOIs
StatePublished - 2001

Keywords

  • Cocrpt films
  • Ti underlayer
  • X-ray scattering
  • XANES

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