Summary abstract: Application of reflection high-energy electron diffraction to thin-film growth and characterization

P. I. Cohen, P. R. Pukite

Research output: Contribution to journalArticlepeer-review

3 Scopus citations
Original languageEnglish (US)
Pages (from-to)2027-2028
Number of pages2
JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volume5
Issue number4
DOIs
StatePublished - Jul 1 1987

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