Abstract
Null transmission ellipsometry was employed to study the field induced transition of the surface arrangements in freestanding films of smectic liquid crystals. The interlayer interaction between the two surfaces obtained from the threshold voltage for the transition is found to be antiferroelectric and is quasilong ranged. The possible microscopic origins of the measured interaction and its relevance to the interlayer interaction in antiferroelectric liquid crystal materials are discussed.
Original language | English (US) |
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Article number | 027801 |
Journal | Physical review letters |
Volume | 108 |
Issue number | 2 |
DOIs | |
State | Published - Jan 11 2012 |