TEM characterization of deformation and failure mechanisms in 40 nm and 5nm cu/nb nanolayed micro compression pillars

Nathan A. Mara; D. Bhattacharyya; P. Dickerson; R. G. Hoagland; A. Misra

doi:10.1017/S1431927609098596

TEM characterization of deformation and failure mechanisms in 40 nm and 5nm cu/nb nanolayed micro compression pillars

Nathan A. Mara, D. Bhattacharyya, P. Dickerson, R. G. Hoagland, A. Misra

Chemical Engineering and Materials Science

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Original language	English (US)
Pages (from-to)	352-353
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	15
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927609098596
State	Published - Jul 2009

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title = "TEM characterization of deformation and failure mechanisms in 40 nm and 5nm cu/nb nanolayed micro compression pillars",

author = "Mara, {Nathan A.} and D. Bhattacharyya and P. Dickerson and Hoagland, {R. G.} and A. Misra",

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AU - Mara, Nathan A.

AU - Bhattacharyya, D.

AU - Dickerson, P.

AU - Hoagland, R. G.

AU - Misra, A.

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EP - 353

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

TEM characterization of deformation and failure mechanisms in 40 nm and 5nm cu/nb nanolayed micro compression pillars

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