The radiation tolerance of strained Si/SiGe n-MODFETs

Anuj Madan, Bongim Jun, Ryan M. Diestelhorst, Aravind Appaswamy, John D. Cressler, Ronald D. Schrimpf, Daniel M. Fleetwood, Paul W. Marshall, Tamara Isaacs-Smith, John R. Williams, Steven J. Koester

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

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