Abstract
The structural and magnetic properties of τ-MnAl alloy films are studied. The films are derived by annealing from Mn/Al multilayers. τ-MnAl appears when the annealing temperature increases up to 350 °C, but decomposes into γ2-MnAl and β-Mn at 500 °C annealing. Good magnetic properties are obtained after 400-450 °C annealing. Furthermore, τ-MnAl forms in the Mn-Al interface. The saturation magnetization MS increases first with the thickness of Mn (or Al) layers, and then decreases in inverse proportion to that of Mn (or Al) layers. The turning point implies that the thickness of τ-MnAl is no more than 5 nm in the Mn60Al40 films.
Original language | English (US) |
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Pages (from-to) | 185-188 |
Number of pages | 4 |
Journal | Materials Science and Engineering B: Solid-State Materials for Advanced Technology |
Volume | 162 |
Issue number | 3 |
DOIs | |
State | Published - Jun 15 2009 |
Bibliographical note
Funding Information:This work is supported by the NSF of China (grant nos. 60490290, 60678008, 10604016, 50771032, and 50771033), the National Basic Research Program of China (2009CB929201).
Keywords
- Annealing
- Interface
- Multilayers
- τ-MnAl