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The use of reflectance data for in-season soybean yield prediction
Spyridon Mourtzinis, Scott C. Rowntree, Justin J. Suhre, Nicholas H. Weidenbenner, Eric W. Wilson, Vince M. Davis, Seth L. Naeve, Shaun N. Casteel, Brian W. Diers, Paul D. Esker, James E. Specht, Shawn P. Conley
Research output: Contribution to journal › Article › peer-review
10
Scopus
citations