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Thickness dependence of structural and magnetic properties of FePt films
B. C. Lim, J. S. Chen,
J. P. Wang
Electrical and Computer Engineering
Research output
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Contribution to journal
›
Article
›
peer-review
19
Scopus citations
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Engineering & Materials Science
Magnetocrystalline anisotropy
100%
Magnetic properties
60%
Structural properties
54%
Coercive force
34%
Demagnetization
34%
Diffractometers
33%
Magnetron sputtering
33%
Magnetometers
30%
Film thickness
26%
Thin films
23%
X rays
22%
Chemical Compounds
Anisotropy
47%
Demagnetization
41%
Magnetic Property
40%
Coercivity
29%
Superlattice
25%
Liquid Film
24%
X-Ray
15%
Physics & Astronomy
magnetic properties
35%
anisotropy
10%
demagnetization
9%
diffractometers
9%
magnetometers
8%
coercivity
7%
magnetron sputtering
6%
film thickness
6%
direct current
6%
thin films
4%
x rays
3%