Thickness dependence of the exchange bias in epitaxial manganite bilayers

A. L. Kobrinskii, A. M. Goldman, Maria Varela, S. J. Pennycook

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Abstract

Exchange bias has been studied in a series of La2/3Ca 1/3MnO3/La1/3Ca2/3MnO3 bilayers grown on (001) SrTiO3 substrates by ozone-assisted molecular-beam epitaxy. The high crystalline quality of the samples and interfaces has been verified using high-resolution x-ray diffractometry and Z-contrast scanning transmission electron microscopy with electron-energy-loss spectroscopy. The dependence of exchange bias on the thickness of the antiferromagnetic layer has been investigated. A critical value for the onset of the hysteresis loop shift has been determined. An antiferromagnetic anisotropy constant has been obtained by fitting the results to the generalized Meiklejohn-Bean model.

Original languageEnglish (US)
Article number094405
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume79
Issue number9
DOIs
StatePublished - Mar 3 2009

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