Fingerprint
Dive into the research topics of 'TRANSIENT SUBSTRATE CURRENT GENERATION AND DEVICE DEGRADATION IN CMOS CIRCUITS AT 77 K.'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
TRANSIENT SUBSTRATE CURRENT GENERATION AND DEVICE DEGRADATION IN CMOS CIRCUITS AT 77 K.
D. H. Ju, R. K. Reich, J. W. Schrankler, M. S. Holt, G. D. Kirchner
Research output: Contribution to journal › Conference article › peer-review
11
Scopus
citations