Transverse and in-plane pore structure characterisation of paper

Shuiyuan Huang, Amit Goel, Shri Ramaswamy, Bandaru V. Ramarao, Doeung Choi

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

Abstract

X-ray microtomography has been shown to be a viable technique for non-destructively and non-intrusively visualising the three-dimensional structure of the entire thickness of paper and paperboard. A method has been developed to determine the traditional pore structure descriptors such as porosity, fibre-void interface area and pore size distribution for the three-dimensional structure. Results with varying sheet structures compare favourably with conventional mercury intrusion porosimetry data. X-ray microtomography combined with digital image analysis has also been shown to be capable of independently evaluating the in-plane and transverse pore structure characteristics of paper and paperboard. Interestingly, the transverse pore structure appears to be more open with larger pore size distribution compared to the in-plane pore structure. This may help explain the differences in liquid and vapour transport through the in-plane and transverse structures during the paper manufacturing process and during end-use application.

Original languageEnglish (US)
Pages (from-to)230-234
Number of pages5
JournalAppita Journal
Volume55
Issue number3
StatePublished - May 1 2002

Keywords

  • Image analysis
  • In-plane
  • Pore structure
  • Transverse
  • X-ray microtomography

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