Abstract
We report the growth and characterization of ultra-smooth, highly ordered, strained La2/3Ca1/3MnO3±d thin films (approximately 600 Å in thickness). The thin films were deposited by ozone-assisted, block-by-block, molecular beam epitaxy on SrTiO3 (001) substrates without any post-deposition annealing. Scanning tunneling microscopy images showed oriented, unit-cell-high terraces characteristic of a step-flow growth mechanism. The root-mean-square roughness of the surface of an imaged film was determined to be 2 Å. This same film showed negative magnetoresistance values, [R(H=0)-R(Happlied)]/R(H=0), at 150 K of 93% and 5% in applied magnetic fields of 5.12 and 4×10-2 T, respectively.
Original language | English (US) |
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Pages (from-to) | 2571-2573 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 68 |
Issue number | 18 |
DOIs | |
State | Published - 1996 |