TY - GEN
T1 - Using randomization to cope with circuit uncertainty
AU - Safizadeh, Hamid
AU - Tahghighi, Mohammad
AU - Ardestani, Ehsan K.
AU - Tavasoli, Gholamhossein
AU - Bazargan, Kia
PY - 2009
Y1 - 2009
N2 - Future computing systems will feature many cores that run fast, but might show more faults compared to existing CMOS technologies. New software methodologies must be adopted to utilize communication bandwidth and the computational power of few slow, reliable cores that could be employed in such systems to verify the results of the fast, faulty cores. Employing the traditional Triple Module Redundancy (TMR) at core instruction level would not be as effective due to its blind replication of computations. We propose two software development methods that utilize what we call Smart TMR (STMR) and fingerprinting to statistically monitor the results of computations and selectively replicate computations that exhibit faults. Experimental results show significant speedup and reliability improvement over traditional TMR approaches.
AB - Future computing systems will feature many cores that run fast, but might show more faults compared to existing CMOS technologies. New software methodologies must be adopted to utilize communication bandwidth and the computational power of few slow, reliable cores that could be employed in such systems to verify the results of the fast, faulty cores. Employing the traditional Triple Module Redundancy (TMR) at core instruction level would not be as effective due to its blind replication of computations. We propose two software development methods that utilize what we call Smart TMR (STMR) and fingerprinting to statistically monitor the results of computations and selectively replicate computations that exhibit faults. Experimental results show significant speedup and reliability improvement over traditional TMR approaches.
UR - http://www.scopus.com/inward/record.url?scp=70350053130&partnerID=8YFLogxK
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U2 - 10.1109/date.2009.5090775
DO - 10.1109/date.2009.5090775
M3 - Conference contribution
AN - SCOPUS:70350053130
SN - 9783981080155
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 815
EP - 820
BT - Proceedings - 2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2009 Design, Automation and Test in Europe Conference and Exhibition, DATE '09
Y2 - 20 April 2009 through 24 April 2009
ER -