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Voltage Measurement in the Scanning Electron Microscope
A. Gopinath
Electrical and Computer Engineering
Research output
:
Contribution to journal
›
Article
›
peer-review
8
Scopus citations
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Physics & Astronomy
electrical measurement
76%
analyzers
70%
electron microscopes
63%
scanning
50%
electric potential
35%
linearization
30%
retarding
20%
video signals
19%
signal measurement
17%
semiconductor devices
13%
floating
13%
integrated circuits
12%
waveforms
11%
sampling
11%
recording
10%
electron energy
10%
electron beams
9%
mirrors
9%
Engineering & Materials Science
Voltage measurement
100%
Scanning
61%
Electric potential
41%
Linearization
31%
Feedback
20%
Electron beams
18%
Semiconductor devices
18%
Mirrors
16%
Electrons
16%
Integrated circuits
14%
Sampling
11%
Testing
8%