Co82Cr12Pt4Ta4Cr/Glass thin films separately deposited by a DC sputtering system at different working pressure were characterized. Magnetic properties were determined by vibrating sample magnetometer (VSM). X-ray reflectivity (XRR) spectrums were carried out using an MRD system. The interface condition of the films was accurately determined. Interfacial roughness was correlated with magnetic coercivity, due to its ability to partially represent grain size distribution and degradation of the mismatch.
|Original language||English (US)|
|Journal||Digests of the Intermag Conference|
|State||Published - Jan 1 2000|
|Event||2000 IEEE International Magnetics Conference-2000 IEEE INTERMAG - Toronto, Ont, Can|
Duration: Apr 9 2000 → Apr 13 2000