X-ray reflectivity determination of interface roughness and correlated with magnetic coercivity of Co₈₂Cr₁₂Pt₄Ta₄ thin film

Chemical Compounds

• X-Ray Reflectivity Spectra 100%
• Magnetic Coercivity 76%
• Interface Roughness 75%
• Reflectivity 50%
• Sputtering 47%
• Grain Size 40%
• Size Distribution 38%
• Magnetic Property 35%
• Glass 30%
• X-Ray 26%
• Pressure 25%
• Liquid Film 21%

Engineering & Materials Science

• Coercive force 60%
• Sputtering 55%
• Magnetometers 53%
• Magnetic properties 53%
• Thin films 41%
• X rays 39%
• Surface roughness 36%
• Glass 34%
• Degradation 30%

Physics & Astronomy

• magnetometers 43%
• coercivity 40%
• roughness 35%
• sputtering 34%
• direct current 34%
• degradation 32%
• grain size 32%
• reflectance 30%
• magnetic properties 30%
• glass 25%
• thin films 22%
• x rays 19%