15fJ/b static physically unclonable functions for secure chip identification with <2% native bit instability and 140× Inter/Intra PUF hamming distance separation in 65nm

Anastacia Alvarez; Wenfeng Zhao; Massimo Alioto

doi:10.1109/ISSCC.2015.7063023

15fJ/b static physically unclonable functions for secure chip identification with <2% native bit instability and 140× Inter/Intra PUF hamming distance separation in 65nm

Anastacia Alvarez, Wenfeng Zhao, Massimo Alioto

Biomedical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

81 Scopus citations

Abstract

Physically unclonable functions (PUFs) enable information security down to the chip level [1-4]. Arrays of PUF bitcells (Fig. 14.3.1) generate chip-specific keys that are unpredictable, repeatable and cannot be measured externally, thus uniquely identifying the die to counteract chip piracy/counterfeiting and enable lightweight authentication/encryption [1-4]. In silicon PUFs, trustworthy bit generation is achieved by accentuating local process variations through various circuit principles (e.g., delay mismatch) and rejecting global process/voltage/temperature (PVT) variations, layout-dependent process variations and noise [2].

Original language	English (US)
Title of host publication	2015 IEEE International Solid-State Circuits Conference, ISSCC 2015 - Digest of Technical Papers
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	256-257
Number of pages	2
ISBN (Electronic)	9781479962235
DOIs	https://doi.org/10.1109/ISSCC.2015.7063023
State	Published - Mar 17 2015
Event	2015 62nd IEEE International Solid-State Circuits Conference, ISSCC 2015 - Digest of Technical Papers - San Francisco, United States Duration: Feb 22 2015 → Feb 26 2015

Publication series

Name	Digest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume	58
ISSN (Print)	0193-6530

Other

Other	2015 62nd IEEE International Solid-State Circuits Conference, ISSCC 2015 - Digest of Technical Papers
Country/Territory	United States
City	San Francisco
Period	2/22/15 → 2/26/15

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

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Alvarez, A., Zhao, W., & Alioto, M. (2015). 15fJ/b static physically unclonable functions for secure chip identification with <2% native bit instability and 140× Inter/Intra PUF hamming distance separation in 65nm. In 2015 IEEE International Solid-State Circuits Conference, ISSCC 2015 - Digest of Technical Papers (pp. 256-257). Article 7063023 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; Vol. 58). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSCC.2015.7063023

15fJ/b static physically unclonable functions for secure chip identification with <2% native bit instability and 140× Inter/Intra PUF hamming distance separation in 65nm. / Alvarez, Anastacia; Zhao, Wenfeng; Alioto, Massimo.
2015 IEEE International Solid-State Circuits Conference, ISSCC 2015 - Digest of Technical Papers. Institute of Electrical and Electronics Engineers Inc., 2015. p. 256-257 7063023 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; Vol. 58).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Alvarez, A, Zhao, W & Alioto, M 2015, 15fJ/b static physically unclonable functions for secure chip identification with <2% native bit instability and 140× Inter/Intra PUF hamming distance separation in 65nm. in 2015 IEEE International Solid-State Circuits Conference, ISSCC 2015 - Digest of Technical Papers., 7063023, Digest of Technical Papers - IEEE International Solid-State Circuits Conference, vol. 58, Institute of Electrical and Electronics Engineers Inc., pp. 256-257, 2015 62nd IEEE International Solid-State Circuits Conference, ISSCC 2015 - Digest of Technical Papers, San Francisco, United States, 2/22/15. https://doi.org/10.1109/ISSCC.2015.7063023

Alvarez A, Zhao W, Alioto M. 15fJ/b static physically unclonable functions for secure chip identification with <2% native bit instability and 140× Inter/Intra PUF hamming distance separation in 65nm. In 2015 IEEE International Solid-State Circuits Conference, ISSCC 2015 - Digest of Technical Papers. Institute of Electrical and Electronics Engineers Inc. 2015. p. 256-257. 7063023. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference). doi: 10.1109/ISSCC.2015.7063023

Alvarez, Anastacia ; Zhao, Wenfeng ; Alioto, Massimo. / 15fJ/b static physically unclonable functions for secure chip identification with <2% native bit instability and 140× Inter/Intra PUF hamming distance separation in 65nm. 2015 IEEE International Solid-State Circuits Conference, ISSCC 2015 - Digest of Technical Papers. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 256-257 (Digest of Technical Papers - IEEE International Solid-State Circuits Conference).

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15fJ/b static physically unclonable functions for secure chip identification with <2% native bit instability and 140× Inter/Intra PUF hamming distance separation in 65nm

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