A comparison of texture results obtained using precession electron diffraction and neutron diffraction methods at diminishing length scales in ordered bimetallic nanolamellar composites

J. S. Carpenter, X. Liu, A. Darbal, N. T. Nuhfer, R. J. McCabe, S. C. Vogel, J. E. Ledonne, A. D. Rollett, K. Barmak, I. J. Beyerlein, N. A. Mara

Research output: Contribution to journalArticlepeer-review

41 Scopus citations

Abstract

Precession electron diffraction (PED) is used to acquire orientation information in Cu-Nb nanolamellar composites fabricated by accumulative roll bonding (ARB). The resulting maps quantify the grain size, shape, orientation distributions and interface planes in the vicinity of nanometer-thick deformation twins. The PED-based texture results compare favorably with bulk textures provided by neutron diffraction measurements, indicating uniformity in the ARB Cu-Nb texture. Additionally, {1 1 2} Cu||{1 1 2} Nb interfaces are present, suggesting that ARB techniques can lead to stable interfaces with a special crystallography.

Original languageEnglish (US)
Pages (from-to)336-339
Number of pages4
JournalScripta Materialia
Volume67
Issue number4
DOIs
StatePublished - Aug 2012

Bibliographical note

Funding Information:
The authors gratefully acknowledge funding from Semiconductor Research Corporation, Task number 2121.001 and MRSEC program of the NSF under DMR-0520425. Additional funding was supplied through Los Alamos National Laboratory Directed Research and Development Project DR20110029 and by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, Energy Frontier Research Center (EFRC) under Award No. 2008LANL1026 . This work has benefited from the use of the Lujan Neutron Scattering Center at LANSCE, which is funded by the Office of Basic Energy Sciences (DOE) . Los Alamos National Laboratory is operated by Los Alamos National Security, LLC under DOE Contract DE AC52 06NA25396.

Keywords

  • Metals and alloys
  • Multilayers
  • Nanocomposites
  • Neutron diffraction
  • Transmission electron microscopy (TEM)

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