TY - GEN
T1 - Absolute calibration of flats for densely sampled data
AU - Zolcinski-Couet, Marie Christine
AU - Magner, Joseph A.
AU - Zweig, David A.
PY - 1995/12/1
Y1 - 1995/12/1
N2 - Results from a new technique for the absolute calibration of flats are presented. This technique is mathematically exact and, in addition, computationally nonintensive compared to previous techniques. Hence it allows the calibration of flats to a high degree of precision over the entire surface. The accuracy of this new technique is demonstrated through simulated test cases. This technique is currently implemented in the manufacturing cycle of optics (RMS precision of approximately λ/250 at a wavelength of .6328 microns).
AB - Results from a new technique for the absolute calibration of flats are presented. This technique is mathematically exact and, in addition, computationally nonintensive compared to previous techniques. Hence it allows the calibration of flats to a high degree of precision over the entire surface. The accuracy of this new technique is demonstrated through simulated test cases. This technique is currently implemented in the manufacturing cycle of optics (RMS precision of approximately λ/250 at a wavelength of .6328 microns).
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M3 - Conference contribution
AN - SCOPUS:0029489820
SN - 0819418951
SN - 9780819418951
T3 - Proceedings of SPIE - The International Society for Optical Engineering
SP - 81
EP - 88
BT - Proceedings of SPIE - The International Society for Optical Engineering
T2 - Optical Manufacturing and Testing
Y2 - 9 July 1995 through 11 July 1995
ER -