TY - GEN
T1 - Adaptive techniques for overcoming performance degradation due to aging in digital circuits
AU - Kumar, Sanjay V.
AU - Kim, Chris H.
AU - Sapatnekar, Sachin S.
PY - 2009
Y1 - 2009
N2 - Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a major reliability concern in present-day digital circuit design. Further, with the recent usage of Hf-based high-k dielectrics for gate leakage reduction, Positive Bias Temperature Instability (PBTI), the dual effect in NMOS transistors has also reached significant levels. Consequently, designers are required to build in substantial guard- bands into their designs, leading to large area and power overheads, in order to guarantee reliable operation over the lifetime of a chip. We propose a guard-banding technique based on adaptive body bias (ABB) and adaptive supply voltage (ASV), to recover the performance of an aged circuit, and compare its merits over previous approaches.
AB - Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a major reliability concern in present-day digital circuit design. Further, with the recent usage of Hf-based high-k dielectrics for gate leakage reduction, Positive Bias Temperature Instability (PBTI), the dual effect in NMOS transistors has also reached significant levels. Consequently, designers are required to build in substantial guard- bands into their designs, leading to large area and power overheads, in order to guarantee reliable operation over the lifetime of a chip. We propose a guard-banding technique based on adaptive body bias (ABB) and adaptive supply voltage (ASV), to recover the performance of an aged circuit, and compare its merits over previous approaches.
UR - http://www.scopus.com/inward/record.url?scp=64549131250&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=64549131250&partnerID=8YFLogxK
U2 - 10.1109/ASPDAC.2009.4796494
DO - 10.1109/ASPDAC.2009.4796494
M3 - Conference contribution
AN - SCOPUS:64549131250
SN - 9781424427482
T3 - Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
SP - 284
EP - 289
BT - Proceedings of the ASP-DAC 2009
T2 - Asia and South Pacific Design Automation Conference 2009, ASP-DAC 2009
Y2 - 19 January 2009 through 22 January 2009
ER -