Abstract
In this work, we have experimentally demonstrated for the first time, an Analog-to-Digital Converter (ADC) based on the unique voltage-dependent switching probability of a Magnetic Tunnel Junction (MTJ). The switching probability was calculated by applying repetitive voltage pulses and measuring the resolved MTJ states in each sampling time window. Temperature sensitivity and MgO breakdown issues were minimized by optimizing the voltage pulse width. Circuit level techniques were utilized to improve the ADC linearity and increase the input voltage range. The proposed ADC achieves an 8-bit resolution with excellent linearity at 30 and 85°C.
Original language | English (US) |
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Title of host publication | 2015 Symposium on VLSI Technology, VLSI Technology 2015 - Digest of Technical Papers |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | T162-T163 |
ISBN (Electronic) | 9784863485013 |
DOIs | |
State | Published - Aug 25 2015 |
Event | Symposium on VLSI Technology, VLSI Technology 2015 - Kyoto, Japan Duration: Jun 16 2015 → Jun 18 2015 |
Publication series
Name | Digest of Technical Papers - Symposium on VLSI Technology |
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Volume | 2015-August |
ISSN (Print) | 0743-1562 |
Other
Other | Symposium on VLSI Technology, VLSI Technology 2015 |
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Country/Territory | Japan |
City | Kyoto |
Period | 6/16/15 → 6/18/15 |
Bibliographical note
Publisher Copyright:© 2015 JSAP.