An 8-bit Analog-to-Digital Converter based on the voltage-dependent switching probability of a Magnetic Tunnel Junction

Won Ho Choi, Yang Lv, Hoonki Kim, Jian Ping Wang, Chris H. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

In this work, we have experimentally demonstrated for the first time, an Analog-to-Digital Converter (ADC) based on the unique voltage-dependent switching probability of a Magnetic Tunnel Junction (MTJ). The switching probability was calculated by applying repetitive voltage pulses and measuring the resolved MTJ states in each sampling time window. Temperature sensitivity and MgO breakdown issues were minimized by optimizing the voltage pulse width. Circuit level techniques were utilized to improve the ADC linearity and increase the input voltage range. The proposed ADC achieves an 8-bit resolution with excellent linearity at 30 and 85°C.

Original languageEnglish (US)
Title of host publication2015 Symposium on VLSI Technology, VLSI Technology 2015 - Digest of Technical Papers
PublisherInstitute of Electrical and Electronics Engineers Inc.
PagesT162-T163
Volume2015-August
ISBN (Electronic)9784863485013
DOIs
StatePublished - Aug 25 2015
EventSymposium on VLSI Technology, VLSI Technology 2015 - Kyoto, Japan
Duration: Jun 16 2015Jun 18 2015

Other

OtherSymposium on VLSI Technology, VLSI Technology 2015
CountryJapan
CityKyoto
Period6/16/156/18/15

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