An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array

Gyusung Park; Hanzhao Yu; Minsu Kim; Chris H. Kim

doi:10.1109/IRPS46558.2021.9405181

An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array

Gyusung Park, Hanzhao Yu, Minsu Kim, Chris H. Kim

Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Scopus citations

Abstract

An on-chip reliability monitor capable of characterizing all four bias temperature instability (BTI) modes is proposed. Stressed ring oscillators with independent dual power rails are implemented in which odd and even stages of an inverter chain are subject to different stress voltage configurations. A beat frequency detection technique with 3 reference ring oscillators achieves a frequency measurement resolution as low as 0.01% with a short measurement interruption time of 4μ s. Extensive BTI data collected from a 65nm ROSC array is presented for different stress conditions.

Original language	English (US)
Title of host publication	2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781728168937
DOIs	https://doi.org/10.1109/IRPS46558.2021.9405181
State	Published - Mar 2021
Event	2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Virtual, Monterey, United States Duration: Mar 21 2021 → Mar 24 2021

Publication series

Name	IEEE International Reliability Physics Symposium Proceedings
Volume	2021-March
ISSN (Print)	1541-7026

Conference

Conference	2021 IEEE International Reliability Physics Symposium, IRPS 2021
Country/Territory	United States
City	Virtual, Monterey
Period	3/21/21 → 3/24/21

Bibliographical note

Funding Information:
ACKNOWLEDGMENT This work was supported in part by Semiconductor Research Corporation Task No. 2712.017 through the Texas Analog Center of Excellence (TxACE). The authors would also like to thank Drs. Vijay Reddy and Srikanth Krishnan at Texas Instruments for introducing PMOS PBTI issues to us and for the technical feedback and encouragement throughout the project.

Publisher Copyright:
© 2021 IEEE.

Keywords

Bias temperature instability (BTI)
dual power rail
odometer
ring oscillator array

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10.1109/IRPS46558.2021.9405181

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Park, G., Yu, H., Kim, M., & Kim, C. H. (2021). An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array. In 2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings Article 9405181 (IEEE International Reliability Physics Symposium Proceedings; Vol. 2021-March). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IRPS46558.2021.9405181

An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array. / Park, Gyusung; Yu, Hanzhao; Kim, Minsu et al.
2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2021. 9405181 (IEEE International Reliability Physics Symposium Proceedings; Vol. 2021-March).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Park, G, Yu, H, Kim, M & Kim, CH 2021, An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array. in 2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings., 9405181, IEEE International Reliability Physics Symposium Proceedings, vol. 2021-March, Institute of Electrical and Electronics Engineers Inc., 2021 IEEE International Reliability Physics Symposium, IRPS 2021, Virtual, Monterey, United States, 3/21/21. https://doi.org/10.1109/IRPS46558.2021.9405181

Park G, Yu H, Kim M, Kim CH. An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array. In 2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2021. 9405181. (IEEE International Reliability Physics Symposium Proceedings). doi: 10.1109/IRPS46558.2021.9405181

@inproceedings{f75f3224e0b84c27968e5d219d584b35,

title = "An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array",

abstract = "An on-chip reliability monitor capable of characterizing all four bias temperature instability (BTI) modes is proposed. Stressed ring oscillators with independent dual power rails are implemented in which odd and even stages of an inverter chain are subject to different stress voltage configurations. A beat frequency detection technique with 3 reference ring oscillators achieves a frequency measurement resolution as low as 0.01% with a short measurement interruption time of 4μ s. Extensive BTI data collected from a 65nm ROSC array is presented for different stress conditions.",

keywords = "Bias temperature instability (BTI), dual power rail, odometer, ring oscillator array",

author = "Gyusung Park and Hanzhao Yu and Minsu Kim and Kim, {Chris H.}",

note = "Funding Information: ACKNOWLEDGMENT This work was supported in part by Semiconductor Research Corporation Task No. 2712.017 through the Texas Analog Center of Excellence (TxACE). The authors would also like to thank Drs. Vijay Reddy and Srikanth Krishnan at Texas Instruments for introducing PMOS PBTI issues to us and for the technical feedback and encouragement throughout the project. Publisher Copyright: {\textcopyright} 2021 IEEE.; 2021 IEEE International Reliability Physics Symposium, IRPS 2021 ; Conference date: 21-03-2021 Through 24-03-2021",

year = "2021",

month = mar,

doi = "10.1109/IRPS46558.2021.9405181",

language = "English (US)",

series = "IEEE International Reliability Physics Symposium Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings",

}

TY - GEN

T1 - An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array

AU - Park, Gyusung

AU - Yu, Hanzhao

AU - Kim, Minsu

AU - Kim, Chris H.

N1 - Funding Information: ACKNOWLEDGMENT This work was supported in part by Semiconductor Research Corporation Task No. 2712.017 through the Texas Analog Center of Excellence (TxACE). The authors would also like to thank Drs. Vijay Reddy and Srikanth Krishnan at Texas Instruments for introducing PMOS PBTI issues to us and for the technical feedback and encouragement throughout the project. Publisher Copyright: © 2021 IEEE.

PY - 2021/3

Y1 - 2021/3

N2 - An on-chip reliability monitor capable of characterizing all four bias temperature instability (BTI) modes is proposed. Stressed ring oscillators with independent dual power rails are implemented in which odd and even stages of an inverter chain are subject to different stress voltage configurations. A beat frequency detection technique with 3 reference ring oscillators achieves a frequency measurement resolution as low as 0.01% with a short measurement interruption time of 4μ s. Extensive BTI data collected from a 65nm ROSC array is presented for different stress conditions.

AB - An on-chip reliability monitor capable of characterizing all four bias temperature instability (BTI) modes is proposed. Stressed ring oscillators with independent dual power rails are implemented in which odd and even stages of an inverter chain are subject to different stress voltage configurations. A beat frequency detection technique with 3 reference ring oscillators achieves a frequency measurement resolution as low as 0.01% with a short measurement interruption time of 4μ s. Extensive BTI data collected from a 65nm ROSC array is presented for different stress conditions.

KW - Bias temperature instability (BTI)

KW - dual power rail

KW - odometer

KW - ring oscillator array

UR - http://www.scopus.com/inward/record.url?scp=85105590079&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85105590079&partnerID=8YFLogxK

U2 - 10.1109/IRPS46558.2021.9405181

DO - 10.1109/IRPS46558.2021.9405181

M3 - Conference contribution

AN - SCOPUS:85105590079

T3 - IEEE International Reliability Physics Symposium Proceedings

BT - 2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2021 IEEE International Reliability Physics Symposium, IRPS 2021

Y2 - 21 March 2021 through 24 March 2021

ER -

An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array

Abstract

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Keywords

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