Approaching nanoxerography: The use of electrostatic forces to position nanoparticles with 100 nm scale resolution

Heiko O. Jacobs; Stephen A. Campbell; Michael G. Steward

doi:10.1002/1521-4095(20021104)14:21<1553::AID-ADMA1553>3.0.CO;2-9

Approaching nanoxerography: The use of electrostatic forces to position nanoparticles with 100 nm scale resolution

Heiko O. Jacobs, Stephen A. Campbell, Michael G. Steward

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

117 Scopus citations

Abstract

The directed parallel self-assembly of nanoparticles onto charged surface areas was reported. The use of electrostatic forces to position nanoparticles with 100 nm scale resolution was studied. The charged surface areas were fabricated using a parallel method that employs a flexible, electrically conductive, stamp. A resolution of ≅ 1μm was achieved which was 100 times better than the resolution of xerographic copiers.

Original language	English (US)
Pages (from-to)	1553-1557
Number of pages	5
Journal	Advanced Materials
Volume	14
Issue number	21
DOIs	https://doi.org/10.1002/1521-4095(20021104)14:21<1553::AID-ADMA1553>3.0.CO;2-9
State	Published - Nov 4 2002

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Approaching nanoxerography: The use of electrostatic forces to position nanoparticles with 100 nm scale resolution

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