Contamination mediated continuous-wave laser damage of optical materials

Andrew Brown, Albert Ogloza, Kyle Olson, Joseph Talghader

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Free carrier generation due to the presence of absorbing contaminants is considered as a primary mechanism for initiating continuous-wave laser damage in low absorption, high bandgap optical coatings. Thermal, optical, and ion-generation are examined as means of exciting electrons above the bandgap of the material. Once electrons exist above the bandgap, they absorb incident light, causing a runway thermal-Absorption process leading to material breakdown. Testing this theory, high reflectivity distributed Bragg reflectors and half-wave coatings were tested with a 17kW 1070nm continuous wave laser in the presence of carbon contamination. Damage thresholds of titania, tantala, hafnia, alumina, and silica were compared to theory and found to follow similar trends. In an effort to prevent laser damage, samples were conditioned using lower irradiance levels, prior to higher exposure. This was found to reduce absorption by up to 90% as well as increase damage thresholds by over an order of magnitude for some samples.

Original languageEnglish (US)
Title of host publication2016 IEEE Photonics Conference, IPC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages462-463
Number of pages2
ISBN (Electronic)9781509019069
DOIs
StatePublished - Jan 23 2017
Event29th IEEE Photonics Conference, IPC 2016 - Waikoloa, United States
Duration: Oct 2 2016Oct 6 2016

Publication series

Name2016 IEEE Photonics Conference, IPC 2016

Other

Other29th IEEE Photonics Conference, IPC 2016
Country/TerritoryUnited States
CityWaikoloa
Period10/2/1610/6/16

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