@inproceedings{7deea7ea8abf4be48ce4fc2d85b6be32,
title = "Duty-cycle shift under asymmetric BTI aging: A simple characterization method and its application to SRAM timing",
abstract = "The effect of DC BTI stress on the clock signal's duty-cycle has been experimentally verified for the first time based on the precise frequency shift measurement from Ring OSCillators (ROSC). A simple and practical methodology based on the 'silicon odometer' beat-frequency detection framework has been proposed for accurately measuring duty-cycle shifts while preventing unwanted BTI recovery. The measurement results from a 65nm test chip were used to further analyze the impact of asymmetric BTI aging during clock gated mode on SRAM timing signals.",
keywords = "Duty-cycle, SRAM, asymmetric aging, bias temperature instability, degradation",
author = "Xiaofei Wang and John Keane and Pulkit Jain and Vijay Reddy and Kim, {Chris H.}",
year = "2013",
doi = "10.1109/IRPS.2013.6532007",
language = "English (US)",
isbn = "9781479901135",
series = "IEEE International Reliability Physics Symposium Proceedings",
pages = "4A.5.1--4A.5.5",
booktitle = "2013 IEEE International Reliability Physics Symposium, IRPS 2013",
note = "2013 IEEE International Reliability Physics Symposium, IRPS 2013 ; Conference date: 14-04-2013 Through 18-04-2013",
}