Duty-cycle shift under asymmetric BTI aging: A simple characterization method and its application to SRAM timing

Xiaofei Wang, John Keane, Pulkit Jain, Vijay Reddy, Chris H. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Abstract

The effect of DC BTI stress on the clock signal's duty-cycle has been experimentally verified for the first time based on the precise frequency shift measurement from Ring OSCillators (ROSC). A simple and practical methodology based on the 'silicon odometer' beat-frequency detection framework has been proposed for accurately measuring duty-cycle shifts while preventing unwanted BTI recovery. The measurement results from a 65nm test chip were used to further analyze the impact of asymmetric BTI aging during clock gated mode on SRAM timing signals.

Original languageEnglish (US)
Title of host publication2013 IEEE International Reliability Physics Symposium, IRPS 2013
DOIs
StatePublished - Aug 7 2013
Event2013 IEEE International Reliability Physics Symposium, IRPS 2013 - Monterey, CA, United States
Duration: Apr 14 2013Apr 18 2013

Publication series

NameIEEE International Reliability Physics Symposium Proceedings
ISSN (Print)1541-7026

Other

Other2013 IEEE International Reliability Physics Symposium, IRPS 2013
CountryUnited States
CityMonterey, CA
Period4/14/134/18/13

Keywords

  • Duty-cycle
  • SRAM
  • asymmetric aging
  • bias temperature instability
  • degradation

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