Abstract
We investigated the effect of a slight tilt of an r-plane sapphire substrate on the morphological properties of a-plane GaN grown by using metal-organic chemical vapor deposition. The tilt angle of the r-plane sapphire was varied from 0° to -0.65° toward the c-axis of sapphire. Slight tilt angles of the r-plane sapphire toward the c-axis of sapphire ranging from 0° to -0.37° were found to be suitable for growing triangular pit-free a-plane GaN with a microscopically smooth surface. Tilt angles larger than -0.37° improved the crystalline quality in the direction of the m- axis of GaN but caused non-uniform growth and pit formation on the surface.
Original language | English (US) |
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Pages (from-to) | 906-910 |
Number of pages | 5 |
Journal | Journal of the Korean Physical Society |
Volume | 58 |
Issue number | 41 |
DOIs | |
State | Published - Apr 4 2011 |
Externally published | Yes |
Keywords
- MOCVD
- Nonpolar
- Tilt angle
- a-plane GaN
- r-plane sapphire