High-resolution differential optical reflectivity measurements of freestanding liquid-crystal films

S. Pankratz; P. M. Johnson; C. C. Huang

doi:10.1063/1.1305520

High-resolution differential optical reflectivity measurements of freestanding liquid-crystal films

S. Pankratz, P. M. Johnson, C. C. Huang

Physics and Astronomy (Twin Cities)

Research output: Contribution to journal › Review article › peer-review

16 Scopus citations

Abstract

A differential optical reflectivity measurement technique for freestanding films is presented. The system is highly sensitive to changes in the polarization state of the reflected light. The method is used to study the evolution of an optically anisotropic liquid crystalline structure with temperature. In addition we present a reflectivity method for determining the film thickness for films consisting of two to hundreds of layers.

Original language	English (US)
Pages (from-to)	3184-3187
Number of pages	4
Journal	Review of Scientific Instruments
Volume	71
Issue number	8
DOIs	https://doi.org/10.1063/1.1305520
State	Published - Aug 2000

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title = "High-resolution differential optical reflectivity measurements of freestanding liquid-crystal films",

abstract = "A differential optical reflectivity measurement technique for freestanding films is presented. The system is highly sensitive to changes in the polarization state of the reflected light. The method is used to study the evolution of an optically anisotropic liquid crystalline structure with temperature. In addition we present a reflectivity method for determining the film thickness for films consisting of two to hundreds of layers.",

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N2 - A differential optical reflectivity measurement technique for freestanding films is presented. The system is highly sensitive to changes in the polarization state of the reflected light. The method is used to study the evolution of an optically anisotropic liquid crystalline structure with temperature. In addition we present a reflectivity method for determining the film thickness for films consisting of two to hundreds of layers.

AB - A differential optical reflectivity measurement technique for freestanding films is presented. The system is highly sensitive to changes in the polarization state of the reflected light. The method is used to study the evolution of an optically anisotropic liquid crystalline structure with temperature. In addition we present a reflectivity method for determining the film thickness for films consisting of two to hundreds of layers.

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High-resolution differential optical reflectivity measurements of freestanding liquid-crystal films

Abstract

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