Abstract
Unique ZnO/ZnS nanocables were synthesized by the catalyst-free simple thermal vapor transport method. Using the high-resolution transmission electron microscopy, the interface and defect structures of nanocables were investigated. The nanocables were composed of two discrete structures, which grow along [0 0 0 2] or [0 1̄ 1 0] directions in wurtzite and [2 0 0] direction in sphalerite structures. Two-dimensional Moiré fringes appeared in the core area due to a different interplanar spacing between ZnO and ZnS. In the nanocables grown along [0 0 0 2] and [0 1̄ 1 0] direction, stacking faults, which lie in (0 0 0 2) and (0 1̄ 1 0) planes were observed likewise the identical defects were also found in the (1 1 1) plane of the sphalerite structure. This work includes an in-depth discussion regarding the structure and the growth of ZnO/ZnS nanocables.
Original language | English (US) |
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Pages (from-to) | 162-167 |
Number of pages | 6 |
Journal | Journal of Crystal Growth |
Volume | 294 |
Issue number | 2 |
DOIs | |
State | Published - Sep 4 2006 |
Bibliographical note
Funding Information:This research was supported by a grant (code ♯: 05K1501-01210) from ‘Center for Nanostructured Materials Technology’ under ‘21st Century Frontier R&D Programs’ of the Ministry of Science and Technology, Korea.
Keywords
- A1. Heterostructure
- A2. Moiré fringes
- A3. Thermal vapor transport method
- B1. ZnO/ZnS nanocable