Polarization dependence and symmetry analysis in indirect K -edge RIXS

G. Chabot-Couture, J. N. Hancock, P. K. Mang, D. M. Casa, T. Gog, M. Greven

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18 Scopus citations

Abstract

We present a study of the charge-transfer excitations in undoped Nd 2CuO4 using resonant inelastic x-ray scattering (RIXS) at the CuK -edge. At the Brillouin zone center, azimuthal scans that rotate the incident-photon polarization within the CuO2 planes reveal weak fourfold oscillations. A comparison of spectra taken in different Brillouin zones reveals a spectral weight decrease at high-energy loss from forward- to back-scattering. We show that these are scattered-photon polarization effects related to the properties of the observed electronic excitations. Each of the two effects constitutes about 10% of the inelastic signal while the " 4p -as-spectator" approximation describes the remaining 80%. Raman selection rules can accurately model our data, and we conclude that the observed polarization-dependent RIXS features correspond to Eg and B 1g charge-transfer excitations to non-bonding oxygen 2p bands, above 2.5 eV energy-loss, and to an Eg d→d excitation at 1.65 eV.

Original languageEnglish (US)
Article number035113
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume82
Issue number3
DOIs
StatePublished - Jul 15 2010

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