This paper presents the development of a higher-order direct boundary integral-displacement discontinuity method for crack propagation in layered elastic materials. The method is based on the dual boundary integral equations of linear elasticity which are solved by means of a quadratic boundary element formulation. The analytical solution for a point force within a bonded half-plane region is used to derive the kernel functions of the boundary integral equations. Square-root displacement-discontinuity elements are used to model the crack tips, and stress intensity factors may be computed using the numerically predicted values of the displacement discontinuity components at the midpoints of these crack-tip elements. An algorithm based on the maximum tensile-stress criterion is then developed and incorporated into the boundary element model to predict the paths of cracks propagating in layered elastic materials. In the experimental part of this study, crack profiles for straight-through-cracked, compact-tension specimens of the anodically bonded silicon/Pyrex glass system are measured by profilometry. The plane strain prediction of the crack-propagation path is compared with the experimentally measured crack profiles. Consistent with the prediction, the interfacial crack is observed to kink away from the strong, anodically-bonded interface and propagate into the more compliant glass layer. The predicted initial kink angle of 26° agrees very well with the average measured value of 28°. The measured path of the crack is also in very good agreement with the predicted path over about the first 120 microns of crack growth with increasing deviation observed beyond that.