Room-temperature water adsorption on the Si(100) surface examined by UPS, XPS, and static SIMS

Engineering & Materials Science

• Secondary ion mass spectrometry 100%
• X ray photoelectron spectroscopy 81%
• Adsorption 64%
• Water 36%
• Binding energy 31%
• Temperature 26%
• DOS 18%
• Hydrides 16%
• Oxygen 16%
• Dangling bonds 12%
• Fermi level 11%
• Hydrogen 10%
• Dimers 10%
• Silicon oxides 9%
• Surface chemistry 8%
• Silanes 8%
• Sodium hydroxide 7%
• Atoms 6%
• Heating 4%

Physics & Astronomy

• secondary ion mass spectrometry 68%
• adsorption 50%
• water 37%
• room temperature 37%
• hydrides 18%
• binding energy 15%
• oxygen 10%
• hydrogen 7%
• experimentation 7%
• symmetry 7%
• silicon oxides 6%
• dimers 5%
• chemistry 5%
• examination 5%
• analogs 4%
• orbitals 4%
• heating 3%
• temperature 3%
• silicon 3%
• atoms 3%

Chemical Compounds

• Ambient Reaction Temperature 37%
• Adsorption 32%
• Hydroxyl 22%
• Surface 21%
• Binding Energy 17%
• Hydride 11%
• Silicon Hydride 10%
• 100-2 9%
• H Group 8%
• Dangling Bond 8%
• Dissociative Adsorption 8%
• Silicon Oxide 8%
• Fermi Level 7%
• Dioxygen 6%
• Surface Chemistry 6%
• Orbital 5%
• Hydrogen 3%