Scanning electrochemical microscopy with shear force feedback. Investigation of the lateral resolution of different experimental configurations

M. Büchler, S. C. Kelley, W. H. Smyrl

Research output: Contribution to journalArticlepeer-review

45 Scopus citations

Abstract

The combination of shear force feedback based on the tuning fork technique with scanning electrochemical microscopy (SECM) allows the concurrent acquisition of an SECM image and sample topography. The technique is used for the detection of electroactive sites on a microgrid electrode in 0.1 M ferricyanide solution. The small separation distance between sample and probe allows the introduction of a new contrast technique based on the modulation of the concentration of ferrocyanide at the probe. This approach is expected to allow the versatile use of SECM even in open-circuit experiments.

Original languageEnglish (US)
Pages (from-to)35-38
Number of pages4
JournalElectrochemical and Solid-State Letters
Volume3
Issue number1
DOIs
StatePublished - Jan 1 2000

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