SE3: Favorite Circuit Design and Testing Mistakes of Starting Engineers

Ramesh Harjani; Mike Chen; Marco Berkhout; Johan Vanderhaegan; Thomas H. Lee; Robert Bogdan Staszewski; Kathleen Philips; Howard C. Luong; Vadim Ivanov

doi:10.1109/ISSCC42613.2021.9365991

SE3: Favorite Circuit Design and Testing Mistakes of Starting Engineers

Ramesh Harjani, Mike Chen, Marco Berkhout, Johan Vanderhaegan, Thomas H. Lee, Robert Bogdan Staszewski, Kathleen Philips, Howard C. Luong, Vadim Ivanov

Electrical and Computer Engineering

Research output: Contribution to journal › Editorial › peer-review

Original language	English (US)
Article number	9365991
Pages (from-to)	541-542
Number of pages	2
Journal	Digest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume	64
DOIs	https://doi.org/10.1109/ISSCC42613.2021.9365991
State	Published - Feb 13 2021
Event	2021 IEEE International Solid-State Circuits Conference, ISSCC 2021 - San Francisco, United States Duration: Feb 13 2021 → Feb 22 2021

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@article{c8f3fbbe19c34b4b879db9a19780d50b,

title = "SE3: Favorite Circuit Design and Testing Mistakes of Starting Engineers",

author = "Ramesh Harjani and Mike Chen and Marco Berkhout and Johan Vanderhaegan and Lee, {Thomas H.} and Staszewski, {Robert Bogdan} and Kathleen Philips and Luong, {Howard C.} and Vadim Ivanov",

year = "2021",

month = feb,

day = "13",

doi = "10.1109/ISSCC42613.2021.9365991",

language = "English (US)",

volume = "64",

pages = "541--542",

journal = "Digest of Technical Papers - IEEE International Solid-State Circuits Conference",

issn = "0193-6530",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "2021 IEEE International Solid-State Circuits Conference, ISSCC 2021 ; Conference date: 13-02-2021 Through 22-02-2021",

}

TY - JOUR

T1 - SE3

T2 - 2021 IEEE International Solid-State Circuits Conference, ISSCC 2021

AU - Harjani, Ramesh

AU - Chen, Mike

AU - Berkhout, Marco

AU - Vanderhaegan, Johan

AU - Lee, Thomas H.

AU - Staszewski, Robert Bogdan

AU - Philips, Kathleen

AU - Luong, Howard C.

AU - Ivanov, Vadim

PY - 2021/2/13

Y1 - 2021/2/13

UR - http://www.scopus.com/inward/record.url?scp=85102385005&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85102385005&partnerID=8YFLogxK

U2 - 10.1109/ISSCC42613.2021.9365991

DO - 10.1109/ISSCC42613.2021.9365991

M3 - Editorial

AN - SCOPUS:85102385005

SN - 0193-6530

VL - 64

SP - 541

EP - 542

JO - Digest of Technical Papers - IEEE International Solid-State Circuits Conference

JF - Digest of Technical Papers - IEEE International Solid-State Circuits Conference

M1 - 9365991

Y2 - 13 February 2021 through 22 February 2021

ER -

SE3: Favorite Circuit Design and Testing Mistakes of Starting Engineers

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