Abstract
The stroboscopic SEM allows very fast periodic events to be examined dynamically. The system components required to allow the SEM to be operated in the stroboscopic mode are reviewed. The periodic event is observed during short pulses, synchronously, at the same phase of the cycle, over many periods. These ″samples″ or pulses are superposed to give the dynamic observation.
| Original language | English (US) |
|---|---|
| Pages | 235-241 |
| Number of pages | 7 |
| State | Published - 1974 |
| Externally published | Yes |
| Event | Scanning Electron Microsc, Symp, 7th Annu, Proc - Chicago, IL, USA Duration: Apr 8 1974 → Apr 11 1974 |
Other
| Other | Scanning Electron Microsc, Symp, 7th Annu, Proc |
|---|---|
| City | Chicago, IL, USA |
| Period | 4/8/74 → 4/11/74 |